Francis Balestra: search on Z-Library

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1

Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40nm floating gate embedded-flash memory

Dobri, Adam, Jeannot, Simon, Piazza, Fausto, Jahan, Carine, Coignus, Jean, Perniola, Luca, Balestra, Francis

Journal:

Microelectronics Reliability

Year:

2017

Language:

english

File:

PDF, 1.41 MB

english, 2017

2

Low frequency noise in 0.12 μm partially and fully depleted SOI technology

François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 269 KB

english, 2003

3

Beyond-CMOS Nanodevices 1 (Balestra/Beyond-CMOS Nanodevices 1) || List of Authors

Balestra, Francis

Year:

2014

File:

PDF, 139 KB

2014

4

Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs

François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 681 KB

english, 2004

5

[Engineering Materials] Semiconductor-On-Insulator Materials for Nanoelectronics Applications Volume 5H || SOI Nanowire Transistors for Femtomole Electronic Detectors of Single Particles and Molecules in Bioliquids and Gases

Nazarov, Alexei, Colinge, J.-P., Balestra, Francis, Raskin, Jean-Pierre, Gamiz, Francisco, Lysenko, V.S.

Year:

2011

Language:

english

File:

PDF, 418 KB

english, 2011

6

Beyond-CMOS Nanodevices 1 (Balestra/Beyond-CMOS Nanodevices 1) || Integration of Silicon Nanowires with CMOS

Balestra, Francis

Year:

2014

Language:

english

File:

PDF, 361 KB

english, 2014

7

A method for MOSFET parameter extraction at very low temperature

Gerard Ghibaudo, Francis Balestra

Journal:

Solid-State Electronics

Year:

1989

Language:

english

File:

PDF, 221 KB

english, 1989

8

New parameter extraction method based on split C–V measurements in FDSOI MOSFETs

Ben Akkez, Imed, Cros, Antoine, Fenouillet-Beranger, Claire, Boeuf, Frederic, Rafhay, Q., Balestra, Francis, Ghibaudo, Gérard

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 502 KB

english, 2013

9

[IEEE 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Athens, Greece (2017.4.3-2017.4.5)] 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Evaluation of ONO compatibility with high-k metal gate stacks for future embedded flash products

Dobri, Adam, Morillon, Dann, Jeannot, Simon, Piazza, Fausto, Jahan, Carine, Toffoli, Alain, Perniola, Luca, Balestra, Francis

Year:

2017

Language:

english

File:

PDF, 357 KB

english, 2017

10

Characterization and modeling of capacitances in FD-SOI devices

Imed Ben Akkez, Antoine Cros, Claire Fenouillet-Beranger, P. Perreau, A. Margain, Frederic Boeuf, Francis Balestra, Gérard Ghibaudo

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 1.05 MB

english, 2012

11

SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise in Devices and Circuits - An overview of low-frequency noise in advanced CMOS/SOI transistors

Jomaah, Jalal, Balestra, Francis, Deen, M. Jamal, Celik-Butler, Zeynep, Levinshtein, Michael E.

Year:

2003

Language:

english

File:

PDF, 290 KB

english, 2003

12

Beyond-CMOS Nanodevices 1 (Balestra/Beyond-CMOS Nanodevices 1) || Nanowire-Based Solar Cells

Balestra, Francis

Year:

2014

Language:

english

File:

PDF, 1.94 MB

english, 2014

13

[Engineering Materials] Semiconductor-On-Insulator Materials for Nanoelectronics Applications ||

Nazarov, Alexei, Colinge, J.-P., Balestra, Francis, Raskin, Jean-Pierre, Gamiz, Francisco, Lysenko, V.S.

Year:

2011

Language:

english

File:

PDF, 15.79 MB

english, 2011

14

Beyond-CMOS Nanodevices 2 (Balestra/Beyond-CMOS Nanodevices 2) || Nanowire Devices

Balestra, Francis

Year:

2014

Language:

english

File:

PDF, 3.98 MB

english, 2014

15

Metal evaporation dependent charge injection in organic transistors

Xu, Yong, Liu, Chuan, Sun, Huabin, Balestra, Francis, Ghibaudo, Gerard, Scheideler, Will, Noh, Yong-Young

Journal:

Organic Electronics

Year:

2014

Language:

english

File:

PDF, 1.14 MB

english, 2014

16

4-Aryl piperazine and piperidine amides as novel mGluR5 positive allosteric modulators

Hui Xiong, Todd A. Brugel, Michael Balestra, Dean G. Brown, Kelly A. Brush, Caprice Hightower, Lindsay Hinkley, Valerie Hoesch, James Kang, Gerard M. Koether, John P. McCauley Jr., Francis M. McLaren,

Journal:

Bioorganic & Medicinal Chemistry Letters

Year:

2010

Language:

english

File:

PDF, 1.26 MB

english, 2010

17

Performance and new effects in advanced SOI devices and materials

Francis Balestra, Jalal Jomaah

Journal:

Microelectronic Engineering

Year:

2005

Language:

english

File:

PDF, 432 KB

english, 2005

18

Power transfer-length method for full biasing contact resistance evaluation of organic field-effect transistors

Yong Xu, Takeo Minari, Kazuhito Tsukagoshi, Romain Gwoziecki, Romain Coppard, Francis Balestra, Gerard Ghibaudo

Journal:

Organic Electronics

Year:

2011

Language:

english

File:

PDF, 964 KB

english, 2011

19

[Engineering Materials] Semiconductor-On-Insulator Materials for Nanoelectronics Applications || Floating-Body SOI Memory: The Scaling Tournament

Nazarov, Alexei, Colinge, J.-P., Balestra, Francis, Raskin, Jean-Pierre, Gamiz, Francisco, Lysenko, V.S.

Year:

2011

Language:

english

File:

PDF, 1.42 MB

english, 2011

20

[Engineering Materials] Semiconductor-On-Insulator Materials for Nanoelectronics Applications || Single Dopant and Single Electron Effects in CMOS Devices

Nazarov, Alexei, Colinge, J.-P., Balestra, Francis, Raskin, Jean-Pierre, Gamiz, Francisco, Lysenko, V.S.

Year:

2011

Language:

english

File:

PDF, 605 KB

english, 2011

21

Joule's law for organic transistors exploration: Case of contact resistance

Xu, Yong, Liu, Chuan, Li, Yun, Minari, Takeo, Darmawan, Peter, Balestra, Francis, Ghibaudo, Gerard, Tsukagoshi, Kazuhito

Journal:

Journal of Applied Physics

Year:

2013

Language:

english

File:

PDF, 1.23 MB

english, 2013

22

Essential Effects on the Mobility Extraction Reliability for Organic Transistors

Xu, Yong, Sun, Huabin, Liu, Ao, Zhu, Huihui, Li, Binhong, Minari, Takeo, Balestra, Francis, Ghibaudo, Gerard, Noh, Yong-Young

Journal:

Advanced Functional Materials

Year:

2018

Language:

english

File:

PDF, 3.61 MB

english, 2018

23

Foreword

Francis Balestra

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 29 KB

english, 2002

24

Carrier mobility in organic field-effect transistors

Xu, Yong, Benwadih, Mohamed, Gwoziecki, Romain, Coppard, Romain, Minari, Takeo, Liu, Chuan, Tsukagoshi, Kazuhito, Chroboczek, Jan, Balestra, Francis, Ghibaudo, Gerard

Journal:

Journal of Applied Physics

Year:

2011

Language:

english

File:

PDF, 2.21 MB

english, 2011

25

Nanoscale CMOS (Innovative Materials, Modeling and Characterization) || Introduction to Part 3

Balestra, Francis

Year:

2013

Language:

english

File:

PDF, 126 KB

english, 2013

26

Beyond-CMOS Nanodevices 1 (Balestra/Beyond-CMOS Nanodevices 1) || Part 1 Silicon Nanowire Biochemical Sensors

Balestra, Francis

Year:

2014

Language:

english

File:

PDF, 132 KB

english, 2014

27

Beyond-CMOS Nanodevices 2 (Balestra/Beyond-CMOS Nanodevices 2) || List of Authors

Balestra, Francis

Year:

2014

Language:

english

File:

PDF, 125 KB

english, 2014

28

Reliable Mobility Evaluation of Organic Field-Effect Transistors with Different Contact Metals

Huang, Fanming, Liu, Ao, Zhu, Huihui, Xu, Yong, Balestra, Francis, Ghibaudo, Gerard, Noh, Yong-Young, Chu, Junhao, Li, Wenwu

Journal:

IEEE Electron Device Letters

Year:

2019

File:

PDF, 6 KB

2019

29

[Engineering Materials] Semiconductor-On-Insulator Materials for Nanoelectronics Applications || Engineering Pseudosubstrates with Porous Silicon Technology

Nazarov, Alexei, Colinge, J.-P., Balestra, Francis, Raskin, Jean-Pierre, Gamiz, Francisco, Lysenko, V.S.

Year:

2011

Language:

english

File:

PDF, 1016 KB

english, 2011

30

Beyond-CMOS Nanodevices 1 (Balestra/Beyond-CMOS Nanodevices 1) || Vibrational Energy Harvesting

Balestra, Francis

Year:

2014

Language:

english

File:

PDF, 2.67 MB

english, 2014

31

Significant roles of low-temperature post-metallization annealing in solution-processed oxide thin-film transistors

Xu, Yong, Liu, Chuan, Amegadze, Paul Seyram K., Park, Won-Tae, Long, Dang Xuan, Minari, Takeo, Balestra, Francis, Ghibaudo, Gerard, Noh, Yong-Young

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 2.09 MB

english, 2014

32

[IEEE 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Hangzhou, China (2016.10.25-2016.10.28)] 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - NanoCMOS and steep switch technologies for ultimate nanoelectronics devices

Balestra, Francis

Year:

2016

Language:

english

File:

PDF, 696 KB

english, 2016

33

Nanoscale CMOS (Innovative Materials, Modeling and Characterization) || Gate Stacks

Balestra, Francis

Year:

2013

Language:

english

File:

PDF, 1.55 MB

english, 2013

34

Beyond-CMOS Nanodevices 1 (Balestra/Beyond-CMOS Nanodevices 1) || Smart Energy Management and Conversion

Balestra, Francis

Year:

2014

Language:

english

File:

PDF, 1.52 MB

english, 2014

35

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Ageing under illumination of MOS transistors for active pixel sensors (APS) applications

Lopez, Diana, Monsieur, Frederic, Ricq, Stephane, Roux, Julien-Marc, Balestra, Francis

Year:

2008

Language:

english

File:

PDF, 2.36 MB

english, 2008

36

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Ageing under illumination of MOS transistors for active pixel sensors (APS) applications

Lopez, Diana, Monsieur, Frederic, Balestra, Francis

Year:

2008

Language:

english

File:

PDF, 417 KB

english, 2008

37

Challenges for high performance and very low power operation at the end of the Roadmap

Balestra, Francis

Journal:

Solid-State Electronics

Year:

2019

Language:

english

File:

PDF, 702 KB

english, 2019

38

Simulation of deep depleted SOI MOSFET's with back potential control

Francis Balestra, Jean Brini, Pierre Gentil

Journal:

Year:

1985

Language:

english

File:

PDF, 246 KB

english, 1985

39

Origin of low-frequency noise in pentacene field-effect transistors

Yong Xu, Takeo Minari, Kazuhito Tsukagoshi, Jan Chroboczek, Francis Balestra, Gerard Ghibaudo

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 494 KB

english, 2011

40

Nanoscale CMOS (Innovative Materials, Modeling and Characterization) || Modeling of End of the Roadmap nMOSFET with Alternative Channel Material

Balestra, Francis

Year:

2013

Language:

english

File:

PDF, 1003 KB

english, 2013

41

[Engineering Materials] Semiconductor-On-Insulator Materials for Nanoelectronics Applications || Investigation of Tri-Gate FinFETs by Noise Methods

Nazarov, Alexei, Colinge, J.-P., Balestra, Francis, Raskin, Jean-Pierre, Gamiz, Francisco, Lysenko, V.S.

Year:

2011

Language:

english

File:

PDF, 1.04 MB

english, 2011

42

Nanoscale CMOS (Innovative Materials, Modeling and Characterization) || Characterization of Interface Defects

Balestra, Francis

Year:

2013

Language:

english

File:

PDF, 947 KB

english, 2013

43

Beyond-CMOS Nanodevices 1 (Balestra/Beyond-CMOS Nanodevices 1) || Part 3 On-Chip Electronic Cooling

Balestra, Francis

Year:

2014

File:

PDF, 54 KB

2014

44

Contact Thickness Effects in Bottom-Contact Coplanar Organic Field-Effect Transistors

Xu, Yong, Scheideler, William, Liu, Chuan, Balestra, Francis, Ghibaudo, Gerard, Tsukagoshi, Kazuhito

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 586 KB

english, 2013

45

Beyond-CMOS Nanodevices 1 (Balestra/Beyond-CMOS Nanodevices 1) || Thermal Energy Harvesting

Balestra, Francis

Year:

2014

Language:

english

File:

PDF, 2.87 MB

english, 2014

46

Beyond-CMOS Nanodevices 1 (Balestra/Beyond-CMOS Nanodevices 1) || Metal Nanolines and Antennas for RF and mm-Wave Applications

Balestra, Francis

Year:

2014

Language:

english

File:

PDF, 2.52 MB

english, 2014

47

Beyond-CMOS Nanodevices 1 (Balestra/Beyond-CMOS Nanodevices 1) || Part 2 New Materials, Devices and Technologies for Energy Harvesting

Balestra, Francis

Year:

2014

Language:

english

File:

PDF, 220 KB

english, 2014

48

[IEEE 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Qingdao, China (2018.10.31-2018.11.3)] 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Nanoscale FETs for high performance and ultra low power operation at the end of the Roadmap

Balestra, Francis

Year:

2018

Language:

english

File:

PDF, 2.75 MB

english, 2018

49

[Engineering Materials] Semiconductor-On-Insulator Materials for Nanoelectronics Applications || FinFETs and Their Futures

Nazarov, Alexei, Colinge, J.-P., Balestra, Francis, Raskin, Jean-Pierre, Gamiz, Francisco, Lysenko, V.S.

Year:

2011

Language:

english

File:

PDF, 850 KB

english, 2011

50

Nanoscale CMOS (Innovative Materials, Modeling and Characterization) || Introduction to Schottky-Barrier MOS Architectures: Concept, Challenges, Material Engineering and Device Integration

Balestra, Francis

Year:

2013

Language:

english

File:

PDF, 1.53 MB

english, 2013

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